X-ray Fluorescence Spectrometer
Development of Highly Sensitive Technique of X-ray Fluorescence Element Analysis
Tech Area / Field
- ENV-MIN/Monitoring and Instrumentation/Environment
- ENV-WPC/Water Pollution and Control/Environment
- INS-MEA/Measuring Instruments/Instrumentation
8 Project completed
Senior Project Manager
VNIIEF, Russia, N. Novgorod reg., Sarov
- Karpov Institute of Physical Chemistry, Russia, Moscow
- Los-Alamos National Laboratory, USA, NM, Los-Alamos\nInstitut für Physikalische und Chemische Analytik, Germany, Geesthacht\nUniversité Louis Pasteur, France, Strasbourg\nUniversity of North Carolina at Wilmington, USA, NC, Wilmington
Project summaryThe need to detect trace elements exists at present in many spheres of scientific and practical activities. In particular, in the fields of environment control, investigation of new materials properties, mining and semiconductor industry instruments meeting modern requirements on detection limit, applicability, promptness and efficiency are needed.
One of the promising instrument of such class is total reflection x-ray spectrometer. Such spectrometers are widely used at present in analytical practice abroad. The development of TXRF methodology in Russia was undertaken in the frames of ISTC project #286. In this project a mock-up TXRF spectrometer was built. Also in this project the possibility to improve parameters and technique of analysis using thin film ion-exchange materials for selective element sorption from solutions under study was considered. The investigations showed that application of thin film sorbents in TXRF is very promising, since it allows to widen the applicability range of the technique sufficiently by increasing analysis sensitivity, simplifying sample preparation procedure, providing promptness and unification of analysis.
However, the work carried out showed that the problems of synthesis and sorption properties of thin film ion-exchange materials are studied insufficiently. To develop simple technology of thin film sorbents production applicable for mass implementation in TXRF, it is necessary to widen and intensify the program of selective sorbents study, and to include other sorbent types, along with ion-exchange materials, in it.
The objective of the project is to study sorption materials of the new class for TXRF analysis, to develop the technology of their mass application in analytical practice and to create the prototype of technique and instrument for commercial use on this basis.
The work will be conducted in the following directions:
- Development of design of commercial TXRF spectrometer prototype.
- Experimental studies and improvement of elements and units of the spectrometer on the laboratory TXRF stand. Optimization of the software.
- The studies on development of technology of synthesis of sorbents selective to elements of different groups. The study of feasibility of spatially restricted fabrication of thin film sorbents. The study of sorption properties of thin film sorbents.
- Conduction of test analytical measurements. Comparison of trace element quantification uses thin film sorbents with TXRF and MXRF.
- Design documentation on trial sample of a commercial TXRF instrument;
- Film sorbent samples for elements (Co, Hg, Cd, Zn, Ni) for environmental research;
- Technical proposals on application of selective film sorbents in analytical techniques (TXRF, MXRF etc.).
Highly qualified scientists from RFNC-VNIIEF and SCC KIPC are employed in the project. Total amount of labor is 546 man-months, including 356 man-months of former weapons scientists.
We intend to continue cooperation with the ISTC Project # 286 collaborators:
- Dr. Heinrich Schwenke /Institut fur Physik, GKSS- Forschungszentrum Geesthacht GmbH, D-21494 Geesthacht, Germany, e-mail: Heinrich.Schwenke@gkss.de fax: 49/4152/87-2534/.
- Dr. Pieter de Bokx /Philips Research Laboratories (WB7), Prof. Holstlaan 4, NL-5656 AA Eindhoven, The Netherlands, phone: +31 40 2742152, fax: +31 40 2743075, e-mail: firstname.lastname@example.org /.
- Prof. Peter Wobrauschek /Atominstitut der Osterreichischen Universitaten, Schuttelstrasse 115, A-1020 Wien, Austria, e-mail: email@example.com, fax: 43 1 7289220/.
- Dr. George Havrilla /Los Alamos National Laboratory, MS G740 Los Alamos, New Mexico 87545, USA, e-mail: firstname.lastname@example.org. fax: 505-665-4737/.
- Dr. Haase /Rich.Seifert &Co, Rontgenwerk, Bugenstr. 41, D-22828 Ahrensburg, Germany/ and Dr. Alexander Grudsky /JV Seifert-Rontgen, St. Petersburg, Russia, e-mail: email@example.com, representative firm Rich.Seifert &Co, Rontgenwerk, Bugenstr. 41, D-22828 Ahrensburg, Germany/.
Additionally, the following scientists agreed to be collaborators in field of physical-chemical research carried out at SSC KIPC (development of the new types of thin film sorbents):
- Prof. William. J. Cooper /Drinking Water Research Center, VH Building, Room 326, Florida International University, 107th Ave., and SW 8th Street, Miami, Florida, 33199, USA/.
- Prof. Yuri Feldman /Department of Applied Physics, The Hebrew University of Jerusalem, Jerusalem, 91904, Israel, Fax: (972) 2 566 3878, e-mail: YURIF@vms.huji.ac.il/.
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