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X-ray Fluorescence Element Analysis


Development of High-Sensitivity Technique for Energy-Dispersion X-ray Fluorescence Element Analysis (XRF).

Tech Area / Field

  • INS-MEA/Measuring Instruments/Instrumentation

8 Project completed

Registration date

Completion date

Senior Project Manager
Horowicz L

Leading Institute
VNIIEF, Russia, N. Novgorod reg., Sarov


  • Philips Research Laboratories, The Netherlands, Eindhoven\nLos-Alamos National Laboratory, USA, NM, Los-Alamos\nAtominstitut der Österreichischen Universitäten / X-ray Laboratory, Austria, Vienna\nGKSS-ForschungZentrum Geesthacht / Institut für Physic, Germany, Geesthacht

Project summary

In many spheres of scientific and engineering activities the methods of study into elemental analysis of substances, which combine a high concentration sensitivity, a multielement character and a high precision with analysis simplicity and efficiency are absolutely essential now.

In particular, the demand for these methods originates in ecology while studying into various natural objects, in production of super-pure substances and materials, in geology while searching for rare and precious minerals, in medical and biological researches and others.

The project objective is the development of a new X-ray spectral analytic technique having a low detection limit (<10~10g/g), a wide range of detected elements (Z = 5 - 92), nondestructiveness and efficiency of the analysis etc., which enables this technique to be used in above spheres almost with no restrictions.

A feature and novelty of the analysis methodology, which is proposed for being developed, are in combining the possibilities of TXRF (total reflection X-ray fluorescence analysis) method and the mechanism of ion-exchange concentration in hyper-fine films.

Expected result:

- operating laboratory facility model;

- technical proposals on prospective schemes of commercial-purpose instruments.

Investigations are supposed to be made in the following areas:

1. Development and study into new physical schemes of TXRF spectrometers based on up-to-date X-ray optics (including selective X-ray optics).

2. Development of ion-exchange materials and study into their properties.

3. Elaboration of a new elemental analysis methodology combining the advantages of TXRF method and ion-exchange concentration.

The principal participators of the project are scientists from the RFNC-VNIIEF (18 persons), who were directly

involved in the institute programs on nuclear-weapons problems.


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